Designed for space-critical applications, the ADR520/ADR525/ADR530/ADR540/ADR550 are high precision shunt voltage references, housed in ultrasmall SC70 and SOT-23 packages. These references feature low temperature drift of 40 ppm/°C, an initial accuracy of better than 0.2%, and ultralow output noise of 14 V p-p.
Available in output voltages of 2.048 V, 2.5 V, 3.0 V, 4.096 V, and 5.0 V, the ADR5xx's advanced design eliminates the need for compensation by an external capacitor, yet the references are stable with any capacitive load. The minimum operating current increases from a mere 50 A to a maximum of 10 mA. This low operating current and ease of use make these references ideally suited for handheld, battery-powered applications.
A TRIM terminal is available on the ADR5xx to allow adjustment of the output voltage over a ±0.5% range, without affecting the temperature coefficient of the device. This feature provides users with the flexibility to trim out any system errors.
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Portable, battery-powered equipmentAutomotivePower suppliesData acquisition systemsInstrumentation and process controlEnergy measurement
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Ultracompact SC70 and SOT-23 packagesTemperature coefficient: 40 ppm/°C (max)2* the tempco improvement over the LM4040Pin compatible with LM4040/LM4050Initial accuracy: ±0.2%Low output voltage noise: 14 V p-p @ 2.5 V outputNo external capacitor requiredOperating current range: 50 A to 10 mAIndustrial temperature range: −40°C to +85°C
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| Parameter |
Rating |
| Reverse Current |
25 mA |
| Forward Current |
20 mA |
| Storage Temperature Range |
65°C to +150°C |
| Industrial Temperature Range |
40°C to +85°C |
| Junction Temperature Range |
65°C to +150°C |
| Lead Temperature Range (Soldering, 60 sec) |
300°C |
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those listed in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
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